Ion Beam Analysis


Ion Beam Analysis (abbreviated IBA) is a windows-based program for the graphical analysis of data from Rutherford BackScattering (RBS) and Elastic Recoil Detection (ERD) material analysis. It uses a full 32-bit instruction set for rapid calculations. The program can evaluate experiments using any incident ion, at any energy, for any planar target. The Tutorial may be helpful for those unfamiliar with scientific data analysis using mouse-based control. The theme of this package is to allow the user to concentrate on the graphical image of the data, and minimize numerical input from the keyboard, in evaluating ion beam data and rapidly producing a thorough and complete analysis.

Material Analysis Using Ion Beam Analysis

Ion Beam Analysis involves sending high energy ion beams into targets, with RBS detecting the scattered ions while ERD detects the sputtered (knocked-out) target atoms. The two types of analysis are experimentally set up differently to enhance the signal-to-noise of their data. In general, ERD is used to analyze light target atoms, from H to O, while RBS is used to analyze heavier atoms, C to U. The advantage of both techniques is that they are quantitative, without calibration samples. Since both techniques use nuclear scattering, the chemical makeup and electronic binding configurations are second order effects on the scattering. The chemistry of the target atoms is seen in the "stopping power" of the ions (the rate that they lose energy in the target) but not in the major scattering events which is the basis of both techniques.

Summary of Features

The IBA software is fully featured with:

(See the IBA Tutorial for illustrations of these features and others. All plots were created with the IBA program, without further editing.)


The following components are required:

The following components are desirable:

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